Performance and functions far exceed conventional norms, allowing you to make the measurements you want.
- Film meander measurement
- Film sheet thickness measurement
- Wafer alignment
High-Performance Film Market
Meander measurement
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Film width measurement
FPD Market
Identification of glass substrate problems
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High-speed detection of substrate problems during transport
Electronic Component Market
Identification of wrongly mixed-in items
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Inline measurement
Inquiries about control products