![K1G](/jp/files/default/2023-03/02_K1G_690_380.jpg)
Performance and functions far exceed conventional norms, allowing you to make the measurements you want.
- Film meander measurement
- Film sheet thickness measurement
- Wafer alignment
High-Performance Film Market
Meander measurement
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![lazer_top03](/jp/files/default/styles/hero_image/public/2023-03/lazer_top03.gif?itok=Vx-5EzVv)
Film width measurement
FPD Market
Identification of glass substrate problems
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![lazer_top04](/jp/files/default/styles/hero_image/public/2023-03/lazer_top04.gif?itok=o9g2vHKV)
High-speed detection of substrate problems during transport
Electronic Component Market
Identification of wrongly mixed-in items
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![lazer_top05](/jp/files/default/styles/hero_image/public/2023-03/lazer_top05.gif?itok=TTy9NEql)
Inline measurement
Inquiries about control products